共 50 条
- [36] Sample-and-hold Imaging for fast scanning in atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (4B): : L582 - L584
- [38] Forward and Retraced Scanning Combined Imaging Method for Fast Scanning Atomic Force Microscopy 2014 33RD CHINESE CONTROL CONFERENCE (CCC), 2014, : 5900 - 5905