Atomic scale imaging of amorphous silicate glass surfaces by scanning force microscopy

被引:19
|
作者
Raberg, W [1 ]
Ostadrahimi, AH [1 ]
Kayser, T [1 ]
Wandelt, K [1 ]
机构
[1] Univ Bonn, Inst Phys & Theoret Chem, D-53115 Bonn, Germany
关键词
D O I
10.1016/j.jnoncrysol.2005.01.022
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The determination of the atomic structure of amorphous materials with conventional diffraction techniques is hindered by the missing periodicity of the samples. Consequently, a deeper insight into the structural properties of glasses can only be obtained in real space. In this work AFM investigations of silicate glass surfaces, namely fresh barium silicate and silica glass fracture surfaces, are described. The observed atomic-scale features and arrangements are compared with each other as well as with results from other methods and discussed in the context of classical glass structure theories. The results clearly demonstrate that AFM is able to provide atomically resolved surface structures of amorphous glass surfaces. (c) 2005 Published by Elsevier B.V.
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页码:1089 / 1096
页数:8
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