Morphology and electrical properties of SrTiO3-films on conductive oxide films

被引:12
|
作者
Reichmann, K
Schneller, T
Hoffmann-Eifert, S
Hasenkox, U
Waser, R
机构
[1] Graz Univ Technol, Inst Chem Technol Anorgan Stoffe, A-8010 Graz, Austria
[2] Rhein Westfal TH Aachen, Inst Werkstoffe Elektrotech, D-52074 Aachen, Germany
[3] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
关键词
capacitors; chemical solution deposition; electrical properties; electron microscopy; perovskites;
D O I
10.1016/S0955-2219(01)00073-5
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effect of various electrically conductive oxides on the morphology and the electrical properties of SrTiO3 films (STO) was investigated by means of scanning electron microscopy, impedance analysis and leakage current measurement (DC). LaNiO3 (LNO), La0.5Sr0.5CoO3 (LSCO) and La0.7Sr0.3MnO3 (LSMO) as electrically conductive oxides were deposited on platinized silicon wafers by chemical solution deposition (CSD) via the propionate route. Subsequently a film of STO was deposited by CSD of an acetate based precursor solution. Platinum contacts were sputtered onto the STO film to act as top electrodes. The STO films in these multilayer structures showed significant differences to STO films grown directly on the platinized substrate with respect to morphology as well as to the electrical properties. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1597 / 1600
页数:4
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