Closed-form physics-based models for threshold voltage and subthreshold slope in FinFETs including 3D effects

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作者
Kloes, A. [1 ]
Weidemann, M. [1 ]
Goebel, D. [1 ]
Bosworth, B. T. [2 ]
机构
[1] Univ Appl Sci Giessen Friedberg, Dept Elect Engn & Informat Technol, Giessen, Germany
[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:437 / +
页数:2
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