resonant inelastic X-ray scattering;
orbital degree of freedom;
perovskite manganites;
D O I:
10.1016/j.physb.2003.11.010
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
The resonant inelastic X-ray scattering (RIXS) is studied theoretically to detect the electronic structure in perovskite manganites with orbital degree of freedom. The general formulae for the polarization dependence of RIXS are derived in the phenomenological point of view. Being based on the microscopic electronic model, the RIXS spectra for hole doped and undoped manganites with orbital order are calculated. (C) 2003 Elsevier B.V. All rights reserved.
机构:
Uppsala Univ, Dept Phys & Astron, Condensed Matter Phys Energy Mat, Xray Photon Sci, POB 516, SE-75120 Uppsala, SwedenUppsala Univ, Dept Phys & Astron, Condensed Matter Phys Energy Mat, Xray Photon Sci, POB 516, SE-75120 Uppsala, Sweden
Butorin, S. M.
Shuh, D. K.
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机构:
Lawrence Berkeley Natl Lab, Chem Sci Div, MS 70A1150, One Cyclotron Rd, Berkeley, CA 94720 USAUppsala Univ, Dept Phys & Astron, Condensed Matter Phys Energy Mat, Xray Photon Sci, POB 516, SE-75120 Uppsala, Sweden