High-resolution electron microscopy studies of island formation during epitaxial growth of semiconductor layers

被引：0

作者：

Jager, W ^{[1
]}

Tillmann, K ^{[1
]}

机构：

[1] Univ Kiel, Dept Engn, Ctr Microanal, D-24143 Kiel, Germany

来源：

ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2 | 1998年

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：361 / 362

页数：2

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