In Situ Spectroscopic Ellipsometry Study of Protein Immobilization on Different Substrates Using Liquid Cells

被引：12

作者：

Nemeth, Andrea ^{[1
]}

Kozma, Peter ^{[1
,2
]}

Huelber, Timea ^{[1
]}

Kurunczi, Sandor ^{[1
]}

Horvath, Robert ^{[1
]}

Petrik, Peter ^{[1
]}

Muskotal, Adel ^{[2
]}

Vonderviszt, Ferenc ^{[1
,2
]}

Hos, Csaba ^{[3
]}

Fried, Miklos ^{[1
]}

Gyulai, Jozsef ^{[1
]}

Barsony, Istvan ^{[1
]}

机构：

[1] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary

[2] Univ Pannonia, Dept Nanotechnol, Res Inst Chem & Proc Engn, Fac Informat Technol, H-8200 Veszprem, Hungary

[3] Budapest Univ Technol & Econ, Dept Hydrodinam Syst, H-1111 Budapest, Hungary

来源：

SENSOR LETTERS | 2010年 / 8卷 / 05期

关键词：

Protein Adsorption; Biosensor; Spectroscopic Ellipsometry; Liquid Cell; FIBRINOGEN ADSORPTION; TIME; SURFACES; LAYERS;

D O I：

10.1166/sl.2010.1338

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The influence of substrate materials on protein adsorption was studied by spectroscopic ellipsometry (SE) and atomic force microscopy. For model proteins fibrinogen and flagellar filaments were chosen and their kinetics of adsorption, surface coverage and adsorbed amount on virgin and chemically activated SiO2 and Ta2O5 thin films were investigated. In case of flagellar filaments the SE data were analyzed with an effective medium model that accounted for the vertical density distribution of the adsorbed protein layer. Adsorption was measured in situ using flow cells with various fluid volume. Compared to commercially available cells, a flow cell with significantly smaller volume was constructed for cost-effective measurements. The development of the flow cell was supported by finite element fluid dynamics calculations.

引用

页码：730 / 735

页数：6

共 50 条

[31] In-situ observation of UV/ozone oxidation of silicon using spectroscopic ellipsometry
Saitoh, T
Kobayashi, D
Kimura, D
Asai, K
IN SITU PROCESS DIAGNOSTICS AND MODELLING, 1999, 569 : 101 - 106
[32] Monitoring of CdTe atomic layer epitaxy using in-situ spectroscopic ellipsometry
Dakshinamurthy, S
Bhat, I
JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (06) : 521 - 526
[33] In situ measurement of the crystallization of amorphous silicon in a vertical furnace using spectroscopic ellipsometry
Petrik, P
Lehnert, W
Schneider, C
Lohner, T
Fried, M
Gyulai, J
Ryssel, H
THIN SOLID FILMS, 2001, 383 (1-2) : 235 - 240
[34] Monitoring of CdTe atomic layer epitaxy using in-situ spectroscopic ellipsometry
S. Dakshinamurthy
I. Bhat
Journal of Electronic Materials, 1998, 27 : 521 - 526
[35] Hot-Wire Assisted ALD: A Study Powered by In Situ Spectroscopic Ellipsometry
Kovalgin, Alexey Y.
Yang, Mengdi
Banerjee, Sourish
Apaydin, Ramazan O.
Aarnink, Antonius A. I.
Kinge, Sachin
Wolters, Rob A. M.
ADVANCED MATERIALS INTERFACES, 2017, 4 (18):
[36] In situ spectroscopic ellipsometry study of low-temperature epitaxial silicon growth
Halagacka, L.
Foldyna, M.
Leal, R.
Roca i Cabarrocas, P.
PHOTONICS AND NANOSTRUCTURES-FUNDAMENTALS AND APPLICATIONS, 2018, 30 : 73 - 77
[37] Control of etch depth in patterned semiconductor substrates using real time spectroscopic ellipsometry
Cho, SJ
Snyder, PG
Ianno, NJ
Herzinger, CM
Johs, B
THIN SOLID FILMS, 2004, 455 : 645 - 649
[38] Real-time plasmon resonance tuning of liquid Ga nanoparticles by in situ spectroscopic ellipsometry
Wu, Pae C.
Kim, Tong-Ho
Brown, April S.
Losurdo, Maria
Bruno, Giovanni
Everitt, Henry O.
APPLIED PHYSICS LETTERS, 2007, 90 (10)
[39] Measuring the thickness of organic/polymer/biological films on glass substrates using spectroscopic ellipsometry
Tompkins, Harland G.
Tiwald, Tom
Bungay, Corey
Hooper, Andrew E.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (04): : 1605 - 1609
[40] Study on TiN film growth mechanism using spectroscopic ellipsometry
Yong Woo Jung
Rae Seo Lee
Jin Ho Kim
Yu Seong Gim
Dong Gi Kim
Moon Gil Kim
Dae Jong Kim
Dong Su Jang
Journal of the Korean Physical Society, 2022, 80 : 185 - 189

← 1 2 3 4 5 →