Roughness of microspheres for force measurements

被引：33

作者：

van Zwol, P. J. ^{[1
,2
]}

Palasantzas, G. ^{[1
,2
]}

van de Schootbrugge, M. ^{[1
,2
]}

de Hosson, J. Th. M. ^{[1
,2
]}

Craig, V. S. J. ^{[3
]}

机构：

[1] Univ Groningen, Dept Appl Phys, Mat Innovat Inst, NL-9747 AG Groningen, Netherlands

[2] Univ Groningen, Zernike Inst Adv Mat, NL-9747 AG Groningen, Netherlands

[3] Australian Natl Univ, Dept Appl Math, Canberra, ACT 0200, Australia

来源：

LANGMUIR | 2008年 / 24卷 / 14期

关键词：

D O I：

10.1021/la800664f

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We have investigated the morphology and surface roughness of several commercially available microspheres to determine their suitability for force measurements using the atomic force microscope. The roughness varies considerably, depending on sphere size and material, ranging from nearly ideally flat up to micrometer-sized features. Because surface roughness significantly influences the magnitude and accuracy of measurement of surface forces, the results presented here should be helpful for colloid physicists and in particular for those performing force measurements.

引用

页码：7528 / 7531

页数：4

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