Anisotropic electric properties of Copper-(II)-Phthalocyanine thin films characterized by a near-field microwave microscope

被引：5

作者：

Babajanyan, Arsen ^{[1
]}

Enkhtur, Lkhamsuren ^{[1
]}

Khishigbadrakh, Balt-Erdene ^{[1
]}

Melikyan, Harutyun ^{[1
]}

Yoon, Youngwoon ^{[1
]}

Kim, Songhui ^{[1
]}

Lee, Hanju ^{[1
]}

Kim, Taedong ^{[1
]}

Lee, Kiejin ^{[1
]}

Friedman, Barry ^{[2
]}

机构：

[1] Sogang Univ, Inst Cell Damage Control, Dept Phys & Basic Sci, Seoul 121742, South Korea

[2] Sam Houston State Univ, Dept Phys, Huntsville, TX 77341 USA

来源：

CURRENT APPLIED PHYSICS | 2011年 / 11卷 / 02期

基金：

新加坡国家研究基金会;

关键词：

CuPc; Treatment conditions; Field-effect transistor; Near-field; Microwave microscope; CARRIER DIFFUSION LENGTH; EFFECT TRANSISTORS; COPPER PHTHALOCYANINE; SURFACE-RESISTANCE; MOBILITY; CHARGE; CUPC;

D O I：

10.1016/j.cap.2010.06.030

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

To study the anisotropic electric transport properties of Copper-(II)-Phthalocyanine (CuPc) thin films we measured the conductivity of a CuPc organic field-effect transistor using a near-field scanning microwave microscope by measuring the microwave reflection coefficient S-11. The orientation of grains depended on the heat-treatment condition and the temperature of the substrate during film deposition. The field-effect mobility of the CuPc thin film annealed at 300 degrees C was increased about 5 times compared to the film formed at room temperature and 17 times larger than that prepared by deposition at 300 degrees C. (C) 2010 Elsevier B. V. All rights reserved.

引用

页码：166 / 170

页数：5

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