Automatic BIST design tool for mixed-signal circuits

被引:1
|
作者
Lin, CJ [1 ]
Haynes, L [1 ]
Mandava, P [1 ]
Prasad, P [1 ]
机构
[1] Intelligent Automat Inc, Rockville, MD 20850 USA
关键词
D O I
10.1109/AUTEST.1998.713427
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
This paper describes the development of a software tool for automating the design process of built-in self-test (BIST) circuits for mixed-signal circuit cards. The purpose of this tool is to generate a complete design of microcontroller-based BIST circuits including hardware and firmware. A typical BIST system generated by this fool consists of a microcontroller, A/D, D/A converters, digital I/Os, digital/analog multiplexers, and a programmable logic device. Several heuristic-based algorithms were developed in this work to optimize the configuration of multiplexers so that the required number of input and output ports is minimized, and the size and number of multiplexers are also reduced. The design tool reported here can greatly simplify the time-consuming procedure of designing BIST circuits and optimize the BIST circuits for mixed-signal circuit cards. A demonstration board is currently under development to evaluate the usability of this fool. The paper focuses on the overall theory and application of the tool, and also describes how it interfaces to the larger tool set we have developed This larger tool set includes tools to help the designer define the level of built-in test required to meet the system maintainability goals.
引用
收藏
页码:97 / 102
页数:6
相关论文
共 50 条
  • [1] BIST module for mixed-signal circuits
    Demidenko, S
    Piuri, V
    Yarmolik, V
    Shmidman, A
    1998 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 1998, : 349 - 354
  • [2] Current-mode BIST structure for mixed-signal circuits
    Hsu, CL
    Huang, KC
    PROCEEDINGS OF THE 4TH INTERNATIONAL SYMPOSIUM ON ELECTRONIC MATERIALS AND PACKAGING, 2002, : 210 - 215
  • [3] A digital BIST for operational amplifiers embedded in mixed-signal circuits
    Rayane, I
    Velasco-Medina, J
    Nicolaidis, M
    17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, : 304 - 310
  • [4] Automatic feasibility/performance estimation of mixed-signal circuits based on design specifications
    Son, KI
    Park, HJ
    Soma, M
    TENTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS, 1997, : 115 - 119
  • [5] ActivIC: Design-Based Automatic Characterization of Mixed-Signal Integrated Circuits
    Moita, Tiago H.
    Almeida, Carlos B.
    dos Santos, Marcelino B.
    JOURNAL OF LOW POWER ELECTRONICS, 2013, 9 (01) : 73 - 88
  • [7] Automatic dependency model generator for mixed-signal circuits
    Haynes, L
    Kelley, B
    Lin, CJ
    Prasad, P
    1998 IEEE AUTOTESTCON PROCEEDINGS - IEEE SYSTEMS READINESS TECHNOLOGY CONFERENCE, 1998, : 91 - 96
  • [8] Mixed-signal BIST: Fact or fiction
    Roberts, GW
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1204 - 1204
  • [9] Mixed-signal BIST: Fact or fiction
    Arabi, K
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1202 - 1202
  • [10] Integrated design and test of mixed-signal circuits
    Engin, Nur
    Kerkhoff, Hans G.
    Tangelder, Ronald J. W. T.
    Speek, Han
    Journal of Electronic Testing: Theory and Applications (JETTA), 1999, 14 (01): : 75 - 83