Femtosecond two-photon laser photoelectron microscopy

被引：8
|
作者：
Sekatskii, SK [1 ]
Chekalin, SV [1 ]
Ivanov, AL [1 ]
Matveets, YA [1 ]
Stepanov, AG [1 ]
Letokhov, VS [1 ]
机构：
[1] Russian Acad Sci, Inst Spect, Troitsk 142092, Moscow Region, Russia
来源：
JOURNAL OF PHYSICAL CHEMISTRY A | 1998年 / 102卷 / 23期
关键词：
D O I：
10.1021/jp973153q
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
It is shown that high-resolution photoelectron images (with a resolution of up to 3 nm for ultrasharp silicon tips) can be obtained for practically all materials when irradiating tips made of these materials by pulses of the second harmonic of a femtosecond Ti:sapphire laser. In addition to the images, absolute values of the two-photon external photoelectric effect for these tips also can be measured using this method. The first experimental realization of this two-photon femtosecond laser projection photoelectron microscope is presented, and corresponding data for silicon, diamond, and calcium fluoride tips are analyzed.
引用
收藏
页码：4148 / 4153
页数：6
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