The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns

被引：23
|
作者：
Fuentes-Montero, Luis [1 ]
Elena Montero-Cabrera, Maria [2 ]
Fuentes-Cobas, Luis [2 ]
机构：
[1] Inst Laue Langevin, Diffract Grp, F-38000 Grenoble, France
[2] Ctr Invest Mat Avanzados, Chihuahua 31109, Mexico
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2011年 / 44卷
关键词：
X-ray diffraction modelling; area detectors; texture analysis; fibre texture; ANAELU; BILBAO CRYSTALLOGRAPHIC SERVER; TEXTURE ANALYSIS; FILMS; SCATTERING; DETECTOR; SYSTEM; SCALES; IMAGE;
D O I：
10.1107/S0021889810048739
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.
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页码：241 / 246
页数：6
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