The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns

被引：23
|
作者：
Fuentes-Montero, Luis [1 ]
Elena Montero-Cabrera, Maria [2 ]
Fuentes-Cobas, Luis [2 ]
机构：
[1] Inst Laue Langevin, Diffract Grp, F-38000 Grenoble, France
[2] Ctr Invest Mat Avanzados, Chihuahua 31109, Mexico
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2011年 / 44卷
关键词：
X-ray diffraction modelling; area detectors; texture analysis; fibre texture; ANAELU; BILBAO CRYSTALLOGRAPHIC SERVER; TEXTURE ANALYSIS; FILMS; SCATTERING; DETECTOR; SYSTEM; SCALES; IMAGE;
D O I：
10.1107/S0021889810048739
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.
引用
收藏
页码：241 / 246
页数：6
相关论文
共 50 条
  • [1] Two-dimensional X-ray diffraction
    Kauffman, George B.
    [J]. FOUNDATIONS OF CHEMISTRY, 2012, 14 (02) : 187 - 188
  • [2] X-ray film as a two-dimensional detector for X-ray diffraction analysis
    Blanton, TN
    [J]. POWDER DIFFRACTION, 2003, 18 (02) : 91 - 98
  • [3] Simulating Powder X-ray Diffraction Patterns of Two-Dimensional Materials
    Jiang, Yibin
    Cao, Lingyun
    Hu, Xuefu
    Ren, Zikun
    Zhang, Cankun
    Wang, Cheng
    [J]. INORGANIC CHEMISTRY, 2018, 57 (24) : 15123 - 15132
  • [4] Stress and texture analysis with two-dimensional x-ray diffraction
    He, BB
    Preckwinkel, U
    Smith, KL
    [J]. ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 : 109 - 114
  • [5] Two-dimensional x-ray diffraction for structure and stress analysis
    He, BPB
    Xu, KW
    Wang, F
    Huang, P
    [J]. RESIDUAL STRESSES VII, PROCEEDINGS, 2005, 490-491 : 1 - 6
  • [6] Algorithms of Two-Dimensional X-Ray Diffraction
    Bob B. He
    [J]. MRS Advances, 2016, 1 (26) : 1921 - 1927
  • [7] Two-Dimensional X-ray Diffraction Detectors
    Blanton, Tom
    [J]. SPECTROSCOPY, 2016, 31 (07) : 42 - 43
  • [8] Algorithms of Two-Dimensional X-Ray Diffraction
    He, Bob B.
    [J]. MRS ADVANCES, 2016, 1 (26): : 1921 - 1927
  • [9] Introduction to two-dimensional X-ray diffraction
    He, BBP
    [J]. POWDER DIFFRACTION, 2003, 18 (02) : 71 - 85
  • [10] BINoculars: Data reduction and analysis software for two-dimensional detectors in surface X-ray diffraction
    20153101104946
    [J]. Roobol, Sander (binoculars@uithetblauw.nl), 1600, International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (48):
12345