Observation of quantized energy levels in a Josephson junction using SFQ circuits

被引：3

作者：

Yamanashi, Y ^{[1
]}

Ito, M ^{[1
]}

Tagami, A ^{[1
]}

Yoshikawa, N ^{[1
]}

机构：

[1] Yokohama Natl Univ, Dept Elect & Comp Engn, Yokohama, Kanagawa 2408501, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2005年 / 15卷 / 02期

关键词：

energy level quantization; Josephson junction; qubit; SFQ circuit;

D O I：

10.1109/TASC.2005.850088

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A single flux quantum (SFQ) circuit to measure quantized energy levels in a Josephson junction has been proposed and implemented, which allows us to perform high-speed and low-noise measurements of the escape rate in Josephson junctions. By using this technique, the measurement of escape rate has been carried out at 4.2 K, the temperature three times higher than the crossover temperature. The test results show periodic dependence of the escape rate on the junction bias current, which is caused by the energy quantization effect in the Josephson junction.

引用

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页码：864 / 867

页数：4

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