RAG: An Efficient Reliability Analysis of Logic Circuits on Graphics Processing Units

被引:0
|
作者
Li, Min [1 ]
Hsiao, Michael S. [1 ]
机构
[1] Virginia Tech, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present RAG, an efficient Reliability Analysis tool based on Graphics processing units (GPU). RAG is a fault injection based parallel stochastic simulator implemented on a state-of-the-art GPU. A two-stage simulation framework is proposed to exploit the high computation efficiency of GPUs. Experimental results demonstrate the accuracy and performance of RAG. An average speedup of 412x and 198x is achieved compared to two state-of-the-art CPU-based approaches for reliability analysis.
引用
收藏
页码:316 / 319
页数:4
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