High-resolution shear-force dependent constant-distance mode SECM.

被引：0
|
作者：
Schuhmann, W
Schulte, A
Etienne, M
Turcu, F
Fritsch, I
机构：
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
[2] Univ Arkansas, Dept Chem & Biochem, Fayetteville, AR 72701 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2003年 / 226卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
196-ANYL
引用
收藏
页码：U132 / U132
页数：1
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