Constant-distance mode scanning electrochemical microscopy. Part II: High-resolution SECM imaging employing Pt nanoelectrodes as miniaturized scanning probes

被引：70
|
作者：
Katemann, BB [1 ]
Schulte, A [1 ]
Schuhmann, W [1 ]
机构：
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
来源：
ELECTROANALYSIS | 2004年 / 16卷 / 1-2期
关键词：
scanning electrochemical microscopy (SECM); high resolution; shear-force detection; constant-distance mode; SECM tip; nanoelectrode;
D O I：
10.1002/elan.200302918
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
The potential of needle-type Pt disk nanoelectrodes as extremely miniaturized scanning probes for high resolution scanning electrochemical microscopy (SECM) was investigated. The accuracy of a piezoelectric shear-force based distance control allowed a precise positioning of the Pt nanoelectrodes in close proximity to the surface of interest not only in tip approach experiments but also throughout scanning and SECM imaging. As proof of the advanced quality of SECM imaging, high-resolution current and topography images of a three-dimensional LIGA microstructure will be presented both simultaneously acquired by operating Pt nanoelectrodes in the constant-distance mode of SECM.
引用
收藏
页码：60 / 65
页数：6
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