Morphological Studies on of Chemically Deposited EuX Thin Films

被引：0
|
作者：
Londhe, C. T. [1 ]
Betkar, M. M. [2 ]
Undre, P. B. [3 ]
机构：
[1] Mahatma Gandhi Mahavidyalaya, Dept Phys, Ahmedpur, Maharashtra, India
[2] Shri Kumarswami Mahavidyalaya, Ausa, Maharashtra, India
[3] Dr Babasaheb Ambedkar Marathwada, Dept Phys, Aurangabad, Maharashtra, India
来源：
INTEGRATED FERROELECTRICS | 2020年 / 205卷 / 01期
关键词：
EuX; spray pyrolysis; scanning electron microscope (SEM);
D O I：
10.1080/10584587.2019.1675004
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The Europium chalcogenide (EuX) thin films have been deposited bare glass substrates by chemically spray pyrolysis technique at different substrate temperatures, in aqueous medium. The films synthesised were studied morphologically. The effect of substrate temperature on morphological properties has been investigated. The XRD studies reveal that the films are polycrystalline in nature and the deposited material was europium sulphide. The SEM analysis conform the formation of small grains on overall substrate.
引用
收藏
页码：95 / 100
页数：6
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