X-ray Tomographic Microscopy at TOMCAT

被引:15
|
作者
Marone, F. [1 ]
Hintermueller, C. [1 ]
McDonald, S. [1 ]
Abela, R. [1 ]
Mikuljan, G. [1 ]
Isenegger, A. [1 ]
Stampanoni, M. [1 ]
机构
[1] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
关键词
D O I
10.1088/1742-6596/186/1/012042
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Synchrotron-based X-ray Tomographic Microscopy is a powerful technique for fast non-destructive, high resolution quantitative volumetric investigations on diverse samples. At the TOMCAT (TOmographic Microscopy and Coherent rAdiology experimenTs) beamline at the Swiss Light Source, synchrotron light is delivered by a 2.9 T superbend. The main optical component, a Double Crystal Multilayer Monochromator, covers an energy range between 8 and 45 keV. The standard TOMCAT detector offers field of views ranging from 0.75x0.75 mm(2) up to 12.1x12.1 mm(2) with a pixel size of 0.37 mu m and 5.92 mu m, respectively. In addition to routine measurements, which exploit the absorption contrast, the high coherence of the source also enables phase contrast tomography, implemented with two complementary techniques (Modified Transport of Intensity approach and Grating Interferometry). Typical acquisition times for a tomogram are in the order of few minutes, ensuring high throughput and allowing for semi-dynamical investigations. Raw data are automatically post-processed online and full reconstructed volumes are available shortly after a scan with minimal user intervention.
引用
收藏
页数:3
相关论文
共 50 条
  • [21] TOMCAT: A beamline for TOmographic Microscopy and Coherent rAdiology experimenTs
    Stampanoni, M.
    Groso, A.
    Isenegger, A.
    Mikuljan, G.
    Chen, Q.
    Meister, D.
    Lange, M.
    Betemps, R.
    Henein, S.
    Abela, R.
    SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007, 879 : 848 - +
  • [22] Combining operando synchrotron X-ray tomographic microscopy and scanning X-ray diffraction to study lithium ion batteries
    Patrick Pietsch
    Michael Hess
    Wolfgang Ludwig
    Jens Eller
    Vanessa Wood
    Scientific Reports, 6
  • [23] Combining operando synchrotron X-ray tomographic microscopy and scanning X-ray diffraction to study lithium ion batteries
    Pietsch, Patrick
    Hess, Michael
    Ludwig, Wolfgang
    Eller, Jens
    Wood, Vanessa
    SCIENTIFIC REPORTS, 2016, 6
  • [24] X-RAY TOMOGRAPHIC MICROSCOPY AS A MEANS TO SYSTEMATICALLY TRACK EXPERIMENTAL DECAY AND FOSSILIZATION
    Selly, Tara
    Schiffbauer, James D.
    PALAIOS, 2021, 36 (06) : 216 - 224
  • [25] Synchrotron-based X-ray tomographic microscopy for rock physics investigations
    Madonna, Claudio
    Quintal, Beatriz
    Frehner, Marcel
    Almqvist, Bjarne S. G.
    Tisato, Nicola
    Pistone, Mattia
    Marone, Federica
    Saenger, Erik H.
    GEOPHYSICS, 2013, 78 (01) : D53 - D64
  • [26] Fighting the Noise: Towards the Limits of Subsecond X-ray Tomographic Microscopy of PEFC
    Xu, H.
    Buehrer, M.
    Marone, F.
    Schmidt, T. J.
    Buechi, F. N.
    Eller, J.
    POLYMER ELECTROLYTE FUEL CELLS 17 (PEFC 17), 2017, 80 (08): : 395 - 402
  • [27] NONDESTRUCTIVE INVESTIGATION OF DAMAGE IN COMPOSITES USING X-RAY TOMOGRAPHIC MICROSCOPY (XTM)
    KINNEY, JH
    STOCK, SR
    NICHOLS, MC
    BONSE, U
    BREUNIG, TM
    SAROYAN, RA
    NUSSHARDT, R
    JOHNSON, QC
    BUSCH, F
    ANTOLOVICH, SD
    JOURNAL OF MATERIALS RESEARCH, 1990, 5 (05) : 1123 - 1129
  • [28] Phase Contrast X-Ray Tomographic Microscopy for Biological and Materials Science Applications
    McDonald, Samuel A.
    Marone, Federica
    Hintermueller, Christoph
    Mikuljan, Gordan
    David, Christian
    Stampanoni, Marco
    ADVANCED ENGINEERING MATERIALS, 2011, 13 (03) : 116 - 121
  • [29] 3-DIMENSIONAL X-RAY MICROSCOPY WITH ACCURATE REGISTRATION OF TOMOGRAPHIC SECTIONS
    DOVER, SD
    ELLIOTT, JC
    BOAKES, R
    BOWEN, DK
    JOURNAL OF MICROSCOPY-OXFORD, 1989, 153 : 187 - 191
  • [30] Towards sub-100-nm X-ray microscopy for tomographic applications
    Bruyndonckx, P.
    Sasov, A.
    Pauwels, B.
    POWDER DIFFRACTION, 2010, 25 (02) : 157 - 160