Strong perpendicular exchange bias in epitaxial La0.7Sr0.3MnO3:LaFeO3 nanocomposite thin films

被引:26
|
作者
Fan, Meng [1 ]
Zhang, Wenrui [2 ]
Jian, Jie [1 ]
Huang, Jijie [2 ]
Wang, Haiyan [1 ,2 ,3 ]
机构
[1] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX 77843 USA
[2] Texas A&M Univ, Dept Mat Sci & Engn, College Stn, TX 77843 USA
[3] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
来源
APL MATERIALS | 2016年 / 4卷 / 07期
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.4958965
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Strong exchange bias (EB) in perpendicular direction has been demonstrated in vertically aligned nanocomposite (VAN) (La0.7Sr0.3MnO3)(1-x) : (LaFeO3)(x) (LSMO:LFO, x = 0.33, 0.5, 0.67) thin films deposited by pulsed laser deposition. Under a moderate magnetic field cooling, an EB field as high as similar to 800 Oe is achieved in the VAN film with x = 0.33, suggesting a great potential for its applications in high density memory devices. Such enhanced EB effects in perpendicular direction can be attributed to the high quality epitaxial co-growth of vertically aligned ferromagnetic LSMO and antiferromagnetic LFO phases, and the vertical interface coupling associated with a disordered spin-glass state. The VAN design paves a powerful way for integrating perpendicular EB effect within thin films and provides a new dimension for advanced spintronic devices. (C) 2016 Author(s).
引用
收藏
页数:8
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