Modeling issues for full-wave numerical EMI simulation

被引：0

作者：

Cracraft, MA ^{[1
]}

Ye, XN ^{[1
]}

Wang, C ^{[1
]}

Chandra, S ^{[1
]}

Drewniak, JL ^{[1
]}

机构：

[1] Univ Missouri, Dept Elect & Comp Engn, Rolla, MO 65401 USA

来源：

2003 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD, VOLS 1 AND 2 | 2003年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In electromagnetic modeling, agreement between modeling and measurements is a common goal. There are questions that define every model. What is to be modeled? How is it going to be modeled? At what scale is it to be modeled? Through sample results and discussion, this paper addresses some general and some specific elements of model veracity. Through determination, numerical models can certainly be pushed to match any measured results. However, in the end the question that this paper addresses is not necessarily "How good can this model be?" as it is "Is this model good enough?"

引用

页码：335 / 340

页数：6

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