Electrodeposition of magnetic thin films of cobalt on silicon

被引:28
|
作者
Munford, ML
Seligman, L
Sartorelli, ML
Voltolini, E
Martins, LFO
Schwarzacher, W
Pasa, AA
机构
[1] Univ Fed Santa Catarina, CFM, Dept Fis, BR-88040900 Florianopolis, SC, Brazil
[2] Univ Fed Santa Catarina, Curso Posgrad Engn Mecan, BR-88040900 Florianopolis, SC, Brazil
[3] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England
关键词
electrodeposition; thin films-magnetic; anisotropy; coercivity-thickness;
D O I
10.1016/S0304-8853(01)00082-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To understand the electrodeposition of Co on Si, sulphate electrolytes containing two different Co ion concentrations were tested. Thin films with uniform thickness, ranging from 10 to 700 nm, low surface roughness, compact and metallic appearance were obtained for Co concentrations of 26 and 104 mM, respectively. Transverse MOKE measurements showed in-plane magnetization with the magnitude of the coercive field being dependent on the thickness of the deposited layers. VSM measurements with the applied field perpendicular to the surface allowed the observation of an out-of-plane remanent magnetization. These properties are of considerable interest for technological applications. (C) 2001 Published by Elsevier Science B.V.
引用
收藏
页码:1613 / 1615
页数:3
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