Study on the ultrafast carrier dynamics in the bulk In0.265GaN thin film

被引:4
|
作者
Zhang, Yi [1 ]
Wen, Xiaoming [1 ]
Feng, Yu [1 ]
Smyth, Tran [1 ]
Huang, Shujuan [1 ]
Shrestha, Santosh [1 ]
Conibeer, Gavin [1 ]
机构
[1] Univ New S Wales, Sydney, NSW 2052, Australia
关键词
third generation solar cells; hot carrier solar cell; InGaN alloy; bulk thin film; carrier dynamics; ultrafast spectroscopy; time-resolved photoluminescence; transient absorption; SPECTROSCOPY;
D O I
10.1016/j.egypro.2015.12.310
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The concepts of third generation solar cells critically depend on the dynamics of ultrafast carrier relaxation and electron-phonon interactions on very short times scales. The hot carrier solar cell is a type of third generation cell which especially depends on the reduction in the energy relaxation rate in an absorber material. We investigated the ultrafast carrier dynamics in 1 m bulk In0.265GaN thin film grown by a new thin-film growth technique called energetic neutral atom-beam lithography/epitaxy (ENABLE) which was done by our collaborators in the Los Alamos National laboratory(LANL), US. Characterization including steady state photoluminescence (SSPL), time-resolved photoluminescence (TRPL) and transient absorption (TA) in the time scale of picoseconds have been measured and analysed. It indicates the overall relaxation time of our sample is about 22.42ps through the Maxwell-Boltzmann approximation. This indicates that the mechanisms are mediated by the Indium content. Moreover, the indium fluctuation introduced extrinsic energy states in the forbidden energy as observed through TRPL. (C) 2015 The Authors. Published by Elsevier Ltd.
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页码:165 / 175
页数:11
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