COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-ELECTRON BACKSCATTER DIFFRACTION

被引：0
|
作者：
Srinivasan, Dheepa [1 ]
机构：
[1] GE Power, GE India Technol Ctr, Bangalore, Karnataka, India
来源：
ADVANCED MATERIALS & PROCESSES | 2017年 / 175卷 / 08期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：37 / 38
页数：2
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