COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-ELECTRON BACKSCATTER DIFFRACTION

被引：0

作者：

Srinivasan, Dheepa ^{[1
]}

机构：

[1] GE Power, GE India Technol Ctr, Bangalore, Karnataka, India

来源：

ADVANCED MATERIALS & PROCESSES | 2017年 / 175卷 / 08期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：37 / 38

页数：2

共 50 条

[1] Cold spray: Advanced characterization methods-x-ray diffraction
Srinivasan, Dheepa
Advanced Materials and Processes, 2016, 174 (10): : 38 - 39
[2] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-TRANSMISSION ELECTRON MICROSCOPY
Srinivasan, Dheepa
ADVANCED MATERIALS & PROCESSES, 2017, 175 (05): : 59 - 62
[3] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS—MICROHARDNESS
Kay, Charles M.
Karthikeyan, J.
Advanced Materials and Processes, 2022, 180 (03): : 37 - 41
[4] Advanced characterization of twins using automated electron backscatter diffraction
Wright, SI
Bingert, J
Mason, TA
Larsen, RJ
TEXTURES OF MATERIALS, PTS 1 AND 2, 2002, 408-4 : 511 - 516
[5] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-RESIDUAL STRESS
Srinivasan, Dheepa
ADVANCED MATERIALS & PROCESSES, 2018, 176 (05): : 44 - 46
[6] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-PART I
Srinivasan, Dheepa
ADVANCED MATERIALS & PROCESSES, 2016, 174 (04): : 48 - 48
[7] Advanced Electron Backscatter Diffraction Applications and Techniques
Lewis, Alexis C.
Wright, Stuart
JOM, 2013, 65 (09) : 1221 - 1221
[8] Advanced Electron Backscatter Diffraction Applications and Techniques
Alexis C. Lewis
Stuart Wright
JOM, 2013, 65 : 1221 - 1221
[9] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-OPTICAL MICROSCOPY
Srinivasan, Dheepa
ADVANCED MATERIALS & PROCESSES, 2016, 174 (07): : 36 - 37
[10] COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-FOCUSED ION BEAM MACHINING AND ELECTRON PROBE MICROANALYSIS
Srinivasan, Dheepa
ADVANCED MATERIALS & PROCESSES, 2017, 175 (04): : 41 - 42

← 1 2 3 4 5 →