Investigation of dual component protein films on graphite with scanning force microscopy

被引:4
|
作者
Ta, TC [1 ]
McDermott, MT [1 ]
机构
[1] Univ Alberta, Dept Chem, Edmonton, AB T6G 2G2, Canada
关键词
scanning force microscopy; friction force microscopy; plasma protein adsorption; competitive protein adsorption;
D O I
10.1016/S0927-7765(03)00178-4
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
Scanning force microscopy (SFM) was used to examine plasma protein films adsorbed on highly oriented pyrolytic graphite (HOPG). Single component films of bovine serum albumin (BSA) and bovine fibrinogen (BFG) were initially investigated to study the effect of protein solution concentration on film morphology. We then studied the adsorption of BFG to a pre-adsorbed partial layer of BSA. We observed no displacement of the BSA during the time-scale of our experiment. BFG adsorbs on top of the initial BSA layer and on the graphite exposed through voids in the partial BSA film. Different adsorption sites result in distinct conformations of the adsorbed BFG that can be detected with compositionally sensitive contrast mechanisms in SFM. Chemically modified probe tips were employed to elucidate whether mechanical properties or interfacial chemistry of the protein films govern the contrast observed. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:191 / 202
页数:12
相关论文
共 50 条
  • [21] Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy
    Uruma, Takeshi
    Satoh, Nobuo
    Yamamoto, Hidekazu
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (08)
  • [22] Structures of surfactant films:: a scanning force microscopy study
    Grunder, R
    Gehr, P
    Bachofen, H
    Schürch, S
    Siegenthaler, H
    [J]. EUROPEAN RESPIRATORY JOURNAL, 1999, 14 (06) : 1290 - 1296
  • [23] Characterization of PZT films by scanning force microscopy (SFM)
    Zavala, G
    TrolierMcKinstry, SE
    Fendler, JH
    [J]. FERROELECTRIC THIN FILMS V, 1996, 433 : 437 - 442
  • [24] SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS
    Cardenas, Galo
    Anaya, Paola
    Del Rio, Rodrigo
    Schrebler, Ricardo
    von Plessing, Carlos
    Schneider, Mark
    [J]. JOURNAL OF THE CHILEAN CHEMICAL SOCIETY, 2010, 55 (03): : 352 - 354
  • [25] SCANNING FORCE MICROSCOPY OF ORGANIC THIN-FILMS
    FROMMER, J
    MEYER, E
    OVERNEY, R
    LUTHI, R
    ANSELMETTI, D
    GUNTHERODT, H
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 205 : 178 - COLL
  • [26] RUBBED POLYIMIDE FILMS STUDIED BY SCANNING FORCE MICROSCOPY
    KIM, YB
    OLIN, H
    PARK, SY
    CHOI, JW
    KOMITOV, L
    MATUSZCZYK, M
    LAGERWALL, ST
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (17) : 2218 - 2219
  • [27] SCANNING TUNNELING MICROSCOPY OF LANGMUIR-BLODGETT FILMS ON GRAPHITE
    LANG, CA
    HORBER, JKH
    HANSCH, TW
    HECKL, WM
    MOHWALD, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 368 - 370
  • [28] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY IN THE CHARACTERIZATION OF ACTIVATED GRAPHITE-ELECTRODES
    FREUND, MS
    BRAJTERTOTH, A
    COTTON, TM
    HENDERSON, ER
    [J]. ANALYTICAL CHEMISTRY, 1991, 63 (10) : 1047 - 1049
  • [29] In situ investigation of retention properties of polydomain ferroelectric thin films by multimode scanning force microscopy
    Wang, Longhai
    Yu, Jun
    Wang, Zhihong
    Zeng, Huizhong
    Wang, Yunbo
    Gao, Junxiong
    [J]. INTEGRATED FERROELECTRICS, 2008, 98 : 26 - 34
  • [30] Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy
    Gruverman, A
    Prakash, SA
    Aggarwal, S
    Ramesh, R
    Auciello, O
    Tokumoto, H
    [J]. FERROELECTRIC THIN FILMS VI, 1998, 493 : 53 - 58