Nucleated dewetting in supported ultra-thin liquid films with hydrodynamic slip

被引:6
|
作者
Lessel, Matthias [1 ]
McGraw, Joshua D. [1 ,2 ]
Baeumchen, Oliver [3 ]
Jacobs, Karin [1 ]
机构
[1] Saarland Univ, Dept Expt Phys, D-66041 Saarbrucken, Germany
[2] PSL Res Univ, CNRS, Ecole Normale Super, Dept Phys, 24 Rue Lhomond, F-75005 Paris, France
[3] Max Planck Inst Dynam & Self Org MPI DS, D-37077 Gottingen, Germany
基金
加拿大自然科学与工程研究理事会;
关键词
MOLECULAR-WEIGHT-DEPENDENCE; POSITRON-ANNIHILATION; POLYMER-FILMS; POLYSTYRENE FILMS; FREE-VOLUME; SURFACE; GROWTH; DYNAMICS; FORCES;
D O I
10.1039/c7sm00869d
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This study reveals the influence of the surface energy and solid/liquid boundary condition on the breakup mechanism of dewetting ultra-thin polymer films. Using silane self-assembled monolayers, SiO2 substrates are rendered hydrophobic and provide a strong slip rather than a no-slip solid/liquid boundary condition. On undergoing these changes, the thin-film breakup morphology changes dramatically -from a spinodal mechanism to a breakup which is governed by nucleation and growth. The experiments reveal a dependence of the hole density on film thickness and temperature. The combination of lowered surface energy and hydrodynamic slip brings the studied system closer to the conditions encountered in bursting unsupported films. As for unsupported polymer films, a critical nucleus size is inferred from a free energy model. This critical nucleus size is supported by the film breakup observed in the experiments using high speed in situ atomic force microscopy.
引用
收藏
页码:4756 / 4760
页数:5
相关论文
共 50 条
  • [31] Alternative dewetting pathways of thin liquid films
    Yerushalmi-Rozen, R
    Kerle, T
    Klein, J
    [J]. SCIENCE, 1999, 285 (5431) : 1254 - 1256
  • [32] Ultra-thin microporous carbon films
    Petricevic, R
    Pröbstle, H
    Fricke, J
    [J]. CHARACTERIZATION OF POROUS SOLIDS V, 2000, 128 : 361 - 370
  • [33] Ultra-thin films beat evaporation
    Westphal, SP
    [J]. NEW SCIENTIST, 2003, 180 (2419) : 24 - 24
  • [34] Preparation of ultra-thin elastomeric films
    Hamza K. Khattak
    Guanhua Lu
    Lauren A. Dutcher
    Michael A. Brook
    Kari Dalnoki-Veress
    [J]. The European Physical Journal E, 2023, 46
  • [35] MACROSCOPIC ELECTRODYNAMICS OF ULTRA-THIN FILMS
    KHUDIK, BI
    LOZOVSKII, VZ
    NAZARENKOBARYAKHTAR, IV
    [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1989, 153 (01): : 167 - 177
  • [36] Dielectric properties of ultra-thin films
    Nakamura, J
    Ishihara, S
    Ozawa, H
    Natori, A
    [J]. PHYSICS OF SEMICONDUCTORS, PTS A AND B, 2005, 772 : 951 - 952
  • [37] Ultra-thin silicate films on metals
    Shaikhutdinov, Shamil
    Freund, Hans-Joachim
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2015, 27 (44)
  • [38] Phase transformation in ultra-thin films
    Chakraborty, J.
    [J]. RESIDUAL STRESSES IX, 2014, 996 : 860 - 865
  • [39] A review of ultra-thin ferroelectric films
    Yuan, Zi-Lin
    Sun, Yu
    Wang, Dan
    Chen, Ke-Qiu
    Tang, Li-Ming
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2021, 33 (40)
  • [40] RESISTIVITY OF ROUGH ULTRA-THIN FILMS
    KIERUL, J
    LEDZION, J
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 129 (02): : K93 - K95