共 50 条
- [1] Combined NDT methods for characterization of subsurface cracks in concrete SMART SENSOR PHENOMENA, TECHNOLOGY, NETWORKS, AND SYSTEMS 2011, 2011, 7982
- [3] Formation of subsurface cracks in silicon wafers by grinding NANOTECHNOLOGY AND PRECISION ENGINEERING-NAMI JISHU YU JINGMI GONGCHENG, 2018, 1 (03): : 172 - 179
- [4] Grinding induced subsurface cracks in silicon wafers International Journal of Machine Tools and Manufacture, 1999, 39 (07): : 1103 - 1116
- [6] Grinding induced subsurface cracks in silicon wafers INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1999, 39 (07): : 1103 - 1116
- [8] Advanced methods for surface and subsurface defect characterization of optical components OPTICAL METROLOGY ROADMAP FOR THE SEMICONDUCTOR, OPTICAL, AND DATA STORAGE INDUSTRIES, 2000, 4099 : 290 - 298