X-ray Optics

被引：1
|
作者：
Cremer, Jay Theodore, Jr. [1 ]
机构：
[1] Adelphi Technol Inc, Redwood City, CA 94063 USA
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 172: NEUTRON AND X-RAY MICROSCOPY, PT 1 | 2012年 / 172卷
关键词：
D O I：
10.1016/B978-0-12-394422-1.00004-9
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：497 / 559
页数：63
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