Automatic generation of test purposes for testing distributed systems

被引:0
|
作者
Henniger, O
Lu, M
Ural, H
机构
[1] Fraunhofer Inst Secure Telecooperat, D-64295 Darmstadt, Germany
[2] Univ Ottawa, Sch Informat Technol & Engn, Ottawa, ON K1N 6N5, Canada
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中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
In this paper, we present an algorithm for generating test purpose descriptions in form of MSC's from a given labeled event structure that represents the behavior of a system of asynchronously communicating extended finite state machines. The labeled event structure is a non-interleaving behavior model describing the behavior of a system in terms of the partial ordering of events.
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页码:178 / 191
页数:14
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