Importance sampling method of correction for multiple testing in affected sib-pair linkage analysis

被引:6
|
作者
Klein, AP
Kovac, I
Sorant, AJM
Baffoe-Bonnie, A
Doan, BQ
Ibay, G
Lockwood, E
Mandal, D
Santhosh, L
Weissbecker, K
Woo, J
Zambelli-Weiner, A
Zhang, J
Naiman, DQ
Malley, J
Bailey-Wilson, JE [1 ]
机构
[1] NHGRI, Inherited Dis Res Branch, NIH, Baltimore, MD USA
[2] Fox Chase Canc Ctr, Philadelphia, PA 19111 USA
[3] Johns Hopkins Med Sch, CIDR, Baltimore, MD USA
[4] Louisiana State Univ, Hlth Sci Ctr, Dept Genet, New Orleans, LA USA
[5] Tulane Univ, Dept Psychiat & Neurol, New Orleans, LA 70118 USA
[6] Tulane Univ, Hayward Genet Program, New Orleans, LA 70118 USA
[7] Johns Hopkins Univ, Bloomberg Sch Publ Hlth, Dept Epidemiol, Baltimore, MD USA
[8] Johns Hopkins Univ, Dept Math Sci, Baltimore, MD 21218 USA
[9] NIH, Ctr Informat Technol, Bethesda, MD 20892 USA
关键词
D O I
10.1186/1471-2156-4-S1-S73
中图分类号
Q3 [遗传学];
学科分类号
071007 ; 090102 ;
摘要
Using the Genetic Analysis Workshop 13 simulated data set, we compared the technique of importance sampling to several other methods designed to adjust p-values for multiple testing: the Bonferroni correction, the method proposed by Feingold et al., and naive Monte Carlo simulation. We performed affected sib-pair linkage analysis for each of the 100 replicates for each of five binary traits and adjusted the derived p-values using each of the correction methods. The type I error rates for each correction method and the ability of each of the methods to detect loci known to influence trait values were compared. All of the methods considered were conservative with respect to type I error, especially the Bonferroni method. The ability of these methods to detect trait loci was also low. However, this may be partially due to a limitation inherent in our binary trait definitions.
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页数:5
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