Nanometer-scale absorption spectroscopy by near-field photodetection optical microscopy

被引:10
|
作者
Davis, RC [1 ]
Williams, CC [1 ]
机构
[1] UNIV UTAH,DEPT PHYS,SALT LAKE CITY,UT 84112
关键词
D O I
10.1063/1.117403
中图分类号
O59 [应用物理学];
学科分类号
摘要
Near-field photodetection optical microscopy (NPOM) is a fundamentally new approach to near-field optical microscopy. This scanning probe technique uses a nanometer-scale photodiode detector which absorbs optical power directly as it is scanned in the near held of an illuminated sample surface. We have applied NPOM to measure the visible absorption spectrum of. dye molecules embedded in a single 300 nm polystyrene sphere. The near-held absorption spectrum is obtained by measuring the NPOM probe photocurrent while the wavelength of the illumination pump beam is scanned from 450 to 800 nm. Peaks-are identified at 567, 608, and 657 nn in the near-field spectrum of the single-dyed polystyrene sphere. These peak. positions are in good agreement with far-field absorption measurements performed on many dyed polystyrene spheres. (C) 1996 American Institute of Physics.
引用
收藏
页码:1179 / 1181
页数:3
相关论文
共 50 条
  • [41] Nanometer scale polarimetry studies using a near-field scanning optical microscope
    McDaniel, EB
    McClain, SC
    Hsu, JWP
    APPLIED OPTICS, 1998, 37 (01) : 84 - 92
  • [42] Theory of electromagnetic field imaging and spectroscopy in scanning near-field optical microscopy
    Porto, JA
    Carminati, R
    Greffet, JJ
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (08) : 4845 - 4850
  • [43] Absorption coefficient imaging by near-field scanning optical microscopy in bacteria
    de Paula, AM
    Chaves, CR
    Silva, HB
    Weber, G
    APPLIED OPTICS, 2003, 42 (16) : 3005 - 3008
  • [44] Nanometer scale-electrochromic modification of NiO films using a novel technique of scanning near-field optical microscopy
    Iwata, F
    Mikage, K
    Sakaguchi, H
    Kitao, M
    Sasaki, A
    SOLID STATE IONICS, 2003, 165 (1-4) : 7 - 13
  • [45] Spectroscopy of the shear force interaction in scanning near-field optical microscopy
    Hoppe, S
    Ctistis, G
    Paggel, JJ
    Fumagalli, P
    ULTRAMICROSCOPY, 2005, 102 (03) : 221 - 226
  • [46] Scanning near-field optical microscopy and spectroscopy as a tool for chemical analysis
    Zenobi, R
    Deckert, V
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2000, 39 (10) : 1746 - 1756
  • [47] Development of Tip-Enhanced Near-Field Optical Spectroscopy and Microscopy
    Hayazawa, Norihiko
    Tarun, Alvarado
    Taguchi, Atsushi
    Kawata, Satoshi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (08)
  • [49] Scanning near-field optical microscopy/spectroscopy of thin organic films
    Nagahara, LA
    Tokumoto, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 800 - 803
  • [50] Near-field optical microscopy in Jerusalem
    Lewis, A
    Lieberman, K
    BenAmi, NK
    Fish, G
    Khachatryan, E
    Strinkovski, A
    Shalom, S
    Druckmann, S
    Ottolenghi, M
    BenAmi, U
    ISRAEL JOURNAL OF CHEMISTRY, 1996, 36 (01) : 89 - 96