Solid-solid thin film dewetting;
barium;
W(112);
INSTABILITIES;
D O I:
10.1051/mmnp/2019040
中图分类号:
Q [生物科学];
学科分类号:
07 ;
0710 ;
09 ;
摘要:
Solid state dewetting occurs when a thin solid film is heated. The temperature of dewetting depends on the thickness of the film; dewetting can be observed in the range of 1/3 to 1/2 of the bulk melting temperature. While remaining solid, the film behaves in a manner similar to liquids dewetting and agglomerating to forming islands or droplets. One of the possible mechanisms is the conversion of a metastable thin film geometry into a more stable form. Heating the metastable film gives the film atoms higher mobility, and the films retract, dewetting the surface. This atomic motion can be restricted due to surface anisotropy. We present in situ emission microscopy observations of barium thin films deposited onto W(112) by thermal evaporation. From the modeling viewpoint, the evolution of the film in this system could be divided in four stages: (i) the nucleation and growth of the thin film as a simply connected region; (ii) formation of droplets/islands/hillocks; (iii) nucleation of holes; (iv) evolution of the components of the disconnected film to their equilibrium state. We present a continuum model that is qualitatively consistent with the evolution of the film observed at the initial stage of the experiment and discuss the later stages of the evolution of surface structures.
机构:
Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Gazit, Nimrod
Klinger, Leonid
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Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Klinger, Leonid
Rabkin, Eugen
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Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
机构:
Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Fraunhofer Inst Ceram Technol & Syst IKTS, Dept Bio & Nanotechnol, D-01277 Dresden, GermanyTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Sharipova, Aliya
Zlotver, Ivan
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Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Zlotver, Ivan
Sosnik, Alejandro
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Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
Sosnik, Alejandro
Rabkin, Eugen
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机构:
Technion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, IsraelTechnion Israel Inst Technol, Dept Mat Sci & Engn, IL-3200003 Haifa, Israel
机构:
CNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
CNRS, Inst NanoSci Paris, UMR 7588, 4 Pl Jussieu, F-75252 Paris, France
UPMC Univ Paris 06, Univ Sorbonne, UMR 7588, Inst NanoSci Paris, 4 Pl Jussieu, F-75252 Paris, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Jacquet, P.
Podor, R.
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机构:
CEA CNRS UM ENSCM, UMR 5257, Site Marcoule, Inst Chim Separat Marcoule, F-30207 Bagnols Sur Ceze, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Podor, R.
Ravaux, J.
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机构:
CEA CNRS UM ENSCM, UMR 5257, Site Marcoule, Inst Chim Separat Marcoule, F-30207 Bagnols Sur Ceze, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Ravaux, J.
Teisseire, J.
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CNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Teisseire, J.
Gozhyk, I.
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CNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Gozhyk, I.
Jupille, J.
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机构:
CNRS, Inst NanoSci Paris, UMR 7588, 4 Pl Jussieu, F-75252 Paris, France
UPMC Univ Paris 06, Univ Sorbonne, UMR 7588, Inst NanoSci Paris, 4 Pl Jussieu, F-75252 Paris, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France
Jupille, J.
Lazzari, R.
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机构:
CNRS, Inst NanoSci Paris, UMR 7588, 4 Pl Jussieu, F-75252 Paris, France
UPMC Univ Paris 06, Univ Sorbonne, UMR 7588, Inst NanoSci Paris, 4 Pl Jussieu, F-75252 Paris, FranceCNRS St Gobain Rech, UMR 125, Surface Verre & Interfaces, 39 Quai Lucien Lefranc, F-93303 Aubervilliers, France