NetIDE: removing vendor lock-in in SDN

被引:0
|
作者
Doriguzzi-Corin, R. [1 ]
Salvadori, E. [1 ]
Aranda Gutierrez, P. A. [2 ]
Stritzke, C. [3 ]
Leckey, A. [4 ]
Phemius, K. [5 ]
Rojas, E. [6 ]
Guerrero, C. [7 ]
机构
[1] CREATE NET, Trento, Italy
[2] Telefonica I D, Madrid, Spain
[3] Fraunhofer IPT, Aachen, Germany
[4] Intel Labs Europe, Dublin, Ireland
[5] Thales, Hyderabad, Andhra Pradesh, India
[6] Telcaria Ideas SL, Madrid, Spain
[7] IMDEA Networks, Madrid, Spain
关键词
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The objective of the demonstration is to show two of the NetIDE framework benefits: An Integrated Development Environment: one single tool to manage the whole life-cycle of Network Application: from the design, to the implementation, deployment and testing; Network Application re-usability and portability: Network Applications written for many different controller frameworks, e.g. implemented in the past for different environments/needs, can be re-used and executed on top of the controller framework that is currently managing a given network infrastructure; or the other way around, a well-tested Network Application can be ported and executed "as is" on a second network controlled by another controller framework.
引用
收藏
页数:2
相关论文
共 50 条
  • [41] Response of a lock-in amplifier to noise
    Van Baak, D. A.
    Herold, George
    [J]. AMERICAN JOURNAL OF PHYSICS, 2014, 82 (08) : 785 - 797
  • [42] Lock-in shearography: Principle and application
    Menner, Philipp
    Gerhard, Henry
    Busse, Gerd
    [J]. TM-TECHNISCHES MESSEN, 2008, 75 (06) : 390 - 397
  • [43] Lock-in Raman difference spectroscopy
    Bonati, Chiara
    Fay, Victoria
    Dornier, Remy
    Loterie, Damien
    Moser, Christophe
    [J]. OPTICS EXPRESS, 2022, 30 (16): : 28601 - 28613
  • [44] The intertemporal dynamics of consumer lock-in
    Zauberman, G
    [J]. JOURNAL OF CONSUMER RESEARCH, 2003, 30 (03) : 405 - 419
  • [45] Lock-in carrierography of semiconductors and optoelectronics
    Sun, Qiming
    Zhao, Binxing
    Wang, Jing
    [J]. JOURNAL OF APPLIED PHYSICS, 2022, 131 (15)
  • [46] Mode lock-in and friction modelling
    Allgaier, R
    Gaul, L
    Keiper, W
    Willner, K
    [J]. COMPUTATIONAL METHODS IN CONTACT MECHANICS IV, 1999, : 35 - 47
  • [47] The Case Against Data Lock-in
    Fitzpatrick, Brian W.
    Lueck, J. J.
    [J]. COMMUNICATIONS OF THE ACM, 2010, 53 (11) : 42 - 46
  • [48] Optofluidic lock-in spectroscopy on a chip
    Song, Wuzhou
    Psaltis, Demetri
    [J]. 2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2011,
  • [49] "Lock-in" phenomenon in coaxial jets
    Talamelli, Alessandro
    Segalini, Antonio
    [J]. JOURNAL OF VISUALIZATION, 2011, 14 (04) : 305 - 306
  • [50] SAFETY LOCK-IN SWITCH.
    Buchanan, M.E.
    Paulson, T.M.
    [J]. IBM technical disclosure bulletin, 1984, 27 (7 A):