Long term life-tests of bimetal oxide-coated cathode

被引：0

作者：

Roquais, JM ^{[1
]}

Poret, F ^{[1
]}

Wierschke, DJ ^{[1
]}

机构：

[1] SBU Displays, Opt Elect Labs, F-21110 Genlis, France

来源：

IVESC2004: THE 5TH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE PROCEEDINGS | 2004年

关键词：

D O I：

10.1109/IVESC.2004.1414209

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：228 / 228

页数：1

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