Development of a high velocity accessory for atomic force microscopy-based friction measurements -: art. no. 083704

A high velocity accessory for friction force microscopy measurements for velocities up to the mm/s range was developed for a commercial stand-alone atomic force microscope (AFM). The accessory consists of a shear piezo element, which rapidly displaces the sample in the lateral direction, perpendicular to the main axis of the AFM cantilever. Friction forces, which are acquired via conventional optical beam deflection detection, can thus be measured as a function of velocity and load in controlled environment (0-40% relative humidity and 0-40 degrees C). Using the accessory, a broad range of velocities up to several mm/s can be accessed independent of the lateral scan size up to a maximum scan size of 1000 nm. The velocity dependence of friction forces and coefficients was measured on organic [poly(methylmethacrylate)], as well as inorganic [oxidized Si(100)] samples to demonstrate the feasibility and underline the importance of high velocity nanotribology using this accessory. (c) 2005 American Institute of Physics.