Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

被引：3
|
作者：
Morrell, Alexander P. [1 ]
Mosselmans, J. Frederick W. [2 ]
Geraki, Kalotina [2 ]
Ignatyev, Konstantin [2 ]
Castillo-Michel, Hiram [3 ]
Monksfield, Peter [4 ]
Warfield, Adrian T. [4 ,5 ]
Febbraio, Maria [6 ]
Roberts, Helen M. [6 ]
Addison, Owen [6 ,7 ]
Martin, Richard A. [1 ]
机构：
[1] Univ Aston, Sch Engn, Aston Inst Mat Res, Birmingham B4 7ET, W Midlands, England
[2] Diamond Light Source, Harwell Sci & Innovat Campus, Didcot OX11 0DE, Oxon, England
[3] ESRF, F-38043 Grenoble 9, France
[4] NHS Fdn Trust, Univ Hosp Birmingham, Birmingham B15 2TH, W Midlands, England
[5] Univ Birmingham, Coll Med & Dent Sci, Birmingham B15 2TT, W Midlands, England
[6] Univ Alberta, Sch Med & Dent, Edmonton, AB T6G 1C9, Canada
[7] Univ Birmingham, Sch Dent, Biomat Unit, Birmingham B15 2TT, W Midlands, England
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2018年 / 25卷
基金：
加拿大自然科学与工程研究理事会;
关键词：
X-ray fluorescence microscopy; X-ray fluorescence spectroscopy artefacts; DECONVOLUTION;
D O I：
10.1107/S160057751801247X
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Synchrotron radiation X-ray fluorescence microscopy is frequently used to investigate the spatial distribution of elements within a wide range of samples. Interrogation of heterogeneous samples that contain large concentration ranges has the potential to produce image artefacts due to the profile of the X-ray beam. The presence of these artefacts and the distribution of flux within the beam profile can significantly affect qualitative and quantitative analyses. Two distinct correction methods have been generated by referencing the beam profile itself or by employing an adaptive-thresholding procedure. Both methods significantly improve qualitative imaging by removing the artefacts without compromising the low-intensity features. The beam-profile correction method improves quantitative results but requires accurate two-dimensional characterization of the X-ray beam profile.
引用
收藏
页码：1719 / 1726
页数：8
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