Field extension inside guided-mode-resonance filters under a focused beam

被引:10
|
作者
Bierret, Antoine [1 ,2 ]
Vincent, Gregory [1 ]
Jaeck, Julien [1 ]
Pelouard, Jean-Luc [2 ]
Haidar, Riad [1 ]
Pardo, Fabrice [2 ]
机构
[1] ONERA French Aerosp Lab, Chemin Huniere,BP 80100, F-91123 Palaiseau, France
[2] CNRS, Ctr Nanosci & Nanotechnol, Route Nozay, F-91460 Marcoussis, France
关键词
ANGULAR-TOLERANT; METALLIC GRATINGS; OBLIQUE-INCIDENCE;
D O I
10.1364/OL.42.004187
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a theoretical study of the mid-infrared guided mode resonance spectral filters made of two subwavelength metallic gratings and a dielectric waveguide under a focused beam with a finite spot size. This Letter shows that, at the resonant wavelength, the lateral extension of the electromagnetic field in the waveguide is close to the width of the beam. We compare the performance of filters using gratings with a one-slit pattern and gratings with a two-slit pattern, and we show that the latter gratings (biatom gratings) provide a higher transmission and a better limitation of field extension, due to an improved angular acceptance. These results open new perspectives for pixel-sized infrared filters. (C) 2017 Optical Society of America
引用
收藏
页码:4187 / 4190
页数:4
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