Three-dimensional discharge simulation of inductively coupled plasma (ICP) etching reactor

被引:4
|
作者
An YiRan [1 ]
Lu YiJia [1 ]
Li DongSan [2 ]
Chen YaoSong [1 ]
机构
[1] Peking Univ, Dept Mech, Beijing 100871, Peoples R China
[2] N Microelect Co Ltd, Beijing 100016, Peoples R China
来源
关键词
inductively coupled plasma; electron density; electron temperature; power deposition;
D O I
10.1007/s11431-008-0065-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
More and more importance has been attached to inductively coupled plasma (ICP) in semiconductor manufacture. For a deep understanding of the plasma discharge process in the etching reactor, this study made a three-dimensional simulation on the Ar plasma discharge process with the commercial software CFD-ACE, which is according to the real experiment conditions and data supplied by North Microelectronic Corporation. The error of the simulation results is in the range of +/- 20% with credibility. The numerical results show that the three-dimentional spatial distribution of electron density is reduced from the chamber center to the wall. The distribution of electron density, electron temperature and power deposition is related to the shape and placement of the coil.
引用
收藏
页码:674 / 682
页数:9
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