共 50 条
- [1] Development of scanning probe microscope for Auger analysis 1600, Japan Society of Applied Physics (42):
- [2] Development of electron source for Auger electron spectroscopy in scanning probe microscope systems JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (7B): : 4943 - 4947
- [4] Development of the interferometrical scanning probe microscope INTERFEROMETRY XIII: APPLICATIONS, 2006, 6293
- [5] Development of a combined interference microscope objective and scanning probe microscope REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (04): : 1120 - 1126
- [6] Development of large scale scanning probe microscope PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 3, 2004, : 432 - 436
- [8] Development of a Low Temperature Scanning Probe Microscope Journal of Low Temperature Physics, 2008, 150 : 561 - 566
- [9] Analysis of ferroelectric microcapacitors by scanning probe microscope INTEGRATION OF ADVANCED MICRO-AND NANOELECTRONIC DEVICES-CRITICAL ISSUES AND SOLUTIONS, 2004, 811 : 111 - 115