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Experimental detection of stacking faults in rare gas clusters
被引:25
|作者:
Kovalenko, S
Solnyshkin, DD
Verkhovtseva, E
Eremenko, VV
机构:
[1] B. Verkin Inst. for Low Temp. P., Academy of Sciences
关键词:
D O I:
10.1016/0009-2614(96)00021-8
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
The theoretical prediction by van de Waal of stacking faults in rare gas clusters has been verified experimentally. It was established that a defect fee structure has been formed in clusters of mean sizes (N) over bar greater than or equal to 1500 atoms/cluster. The stacking fault density is a linear function of (N) over bar(-1/3). The number of 'defect' planes does not depend on the cluster size and is four.
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页码:309 / 312
页数:4
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