Migration Pinning and Roughening Transition of a Ni Grain Boundary

被引:1
|
作者
Lee, Sung Bo [1 ,2 ]
Jung, Jinwook [1 ,2 ]
Yoo, Seung Jo [3 ]
Han, Heung Nam [1 ,2 ]
机构
[1] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 08826, South Korea
[2] Seoul Natl Univ, RIAM, Seoul 08826, South Korea
[3] Korea Basic Sci Inst, Electron Microscopy Res Ctr, Daejeon 34133, South Korea
基金
新加坡国家研究基金会; 欧盟地平线“2020”;
关键词
FINITE-ELEMENT SIMULATION; 2ND-PHASE PARTICLES; CRYSTAL-GROWTH; INTERFACES;
D O I
10.1007/s11661-019-05579-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To date, much research has been conducted into the effect of migration pinning on the grain size in polycrystalline materials. However, effects of migration pinning on the grain-boundary structure and its transition have not been illuminated. Here, using transmission electron microscopy (TEM) we have explored the pinning effects for the grain boundary in a Ni bicrystal. During TEM specimen preparation, a hole was intentionally drilled in the middle of the grain boundary as a pinning point against grain-boundary migration. The specimen was heated to 600 degrees C. The grain boundary is driven to migrate by both the surface energy anisotropy and the total strain energy reduction. Grain-boundary facets with a plane orientation of {0 3 2}//{1 1 1} appear near the hole. The facets undergo a structural transition from atomically flat to rough with increasing distance from the hole. A pinning force exerted by the hole suppresses the migration of the grain boundary near the hole, indicating that the grain-boundary region away from the hole is subjected to a higher driving force. It certainly appears that the phenomenon originates from a change in driving force with the distance from the hole, being a signature of kinetic roughening.
引用
收藏
页码:1067 / 1074
页数:8
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