共 42 条
- [21] Electromigration-induced plastic deformation in Cu damascene interconnect lines as revealed by Synchrotron X-Ray Microdiffraction MATERIALS, TECHNOLOGY AND RELIABILITY OF LOW-K DIELECTRICS AND COPPER INTERCONNECTS, 2006, 914 : 295 - +
- [24] Measurement of solute profiles by means of synchrotron X-ray radiography during directional solidification of Al-4 wt% Cu alloys SOLIDIFICATION AND GRAVITY V, 2010, 649 : 331 - +
- [25] Effect of heat treatment on the deformation behavior of an Al-Cu alloy studied by in-situ synchrotron X-ray diffraction MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2024, 914