Characterization of non-symmetrical damage in smart plate-like structures

被引：0
|
作者：
Banks, HT [1 ]
Emeric, P [1 ]
机构：
[1] N Carolina State Univ, Ctr Res Sci Corp, Raleigh, NC 27695 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B | 1998年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1817 / 1824
页数：8
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