Photodissociation effects on pulsed laser deposited silver oxide thin films: surface-enhanced resonance Raman scattering

Temporal Raman scattering measurements with 488, 532 and 632 nm excitation wavelengths and normal Raman studies by varying the power (from 30 W/cm(2) to 2MW/cm(2)) at 488 nm were performed on silver oxide thin films prepared by pulsed-laser deposition. Initially, silver oxide Raman spectra were observed with all three excitation wavelengths. With further increase in time and power, silver oxide photodissociated into silver nanostructures. High-intensity spectral lines were observed at 1336 +/- 25 and 1596 +/- 10 cm(-1) with 488 nm excitation. No spectral features were observed with 633 nm excitation. Surface-enhanced resonance Raman scattering theory is used to explain the complex behavior in the intensity of the 1336/1596 cm(-1) lines with varying power of 488 nm excitation. Copyright (c) 2011 John Wiley & Sons, Ltd.