共 50 条
- [1] A new defect inspection method for TFT-LCD panel using pattern comparison Transactions of the Korean Institute of Electrical Engineers, 2008, 57 (02): : 307 - 313
- [2] Inspection of defect on LCD panel using local mean algorithm based on similarity (ICCAS 2013) 2013 13TH INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS (ICCAS 2013), 2013, : 584 - 588
- [3] Morphological blob-Mura defect detection method for TFT-LCD panel inspection KNOWLEDGE-BASED INTELLIGENT INFORMATION AND ENGINEERING SYSTEMS, PT 3, PROCEEDINGS, 2004, 3215 : 862 - 868
- [4] Developing Auto Recipe Management System For LCD Panel Auto Defect Detecting Inspection Machine 2008 PROCEEDINGS OF SICE ANNUAL CONFERENCE, VOLS 1-7, 2008, : 2119 - 2122
- [7] Meshed matching algorithm for LCD panel inspection machine PROCEEDINGS OF SICE ANNUAL CONFERENCE, VOLS 1-8, 2007, : 1648 - 1651
- [8] Automatic Mura Inspection Using the Principal Component Analysis for the TFT-LCD Panel 2014 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN (ICCE-TW), 2014,
- [9] Automatic inspection of etching transistors in TFT-LCD panel 2005 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS, 2005, : 937 - 944
- [10] TFT-LCD panel Blob-Mura inspection using the correlation of wavelet coefficients TENCON 2004 - 2004 IEEE REGION 10 CONFERENCE, VOLS A-D, PROCEEDINGS: ANALOG AND DIGITAL TECHNIQUES IN ELECTRICAL ENGINEERING, 2004, : A219 - A222