Surface analysis of ceramics by time of flight secondary ion mass spectrometry (TOF-SIMS)

被引：0
|
作者：
Smentkowski, Vincent S. [1 ]
机构：
[1] Gen Elect, Global Res Ctr, Niskayuna, NY 12309 USA
来源：
AMERICAN CERAMIC SOCIETY BULLETIN | 2012年 / 91卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：30 / 33
页数：4
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