Surface analysis of ceramics by time of flight secondary ion mass spectrometry (TOF-SIMS)

被引：0

作者：

Smentkowski, Vincent S. ^{[1
]}

机构：

[1] Gen Elect, Global Res Ctr, Niskayuna, NY 12309 USA

来源：

AMERICAN CERAMIC SOCIETY BULLETIN | 2012年 / 91卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：30 / 33

页数：4

共 50 条

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