Cadmium telluride thin-film response for a laser beam illumination

被引：0

作者：

Reddy, Andra Naresh Kumar ^{[1
,2
]}

Khonina, Svetlana Nikolaevna ^{[2
,3
]}

机构：

[1] Weizmann Inst Sci, Dept Phys Complex Syst, IL-7610001 Rehovot, Israel

[2] Samara Natl Res Univ, Moskovskoye Shosse 34, Samara 443086, Russia

[3] Russian Acad Sci, Image Proc Syst Inst, Branch Fed Sci Res Ctr Crystallog & Photon, Samara 443001, Russia

来源：

JOURNAL OF OPTICS-INDIA | 2019年 / 48卷 / 01期

基金：

以色列科学基金会; 俄罗斯基础研究基金会;

关键词：

CdTe thin films; Spot size; FWHM; Diffraction;

D O I：

10.1007/s12596-018-0504-8

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The proposed optical system utilizes a 3mm diameter Nd:YAG tunable laser which passes through the CdTe thin-film disk plate. Originating laser patterns are detected using CMOS camera, and the resolution of the laser pattern is analyzed with the help of well-defined quality criterion, the Full Width Half Maxima (FWHM). The differences between the responses of the system with and without the thin-film plate are compared. Finally, the optical output of the thin film for different visible wavelengths is found to be interesting to establish its field-controlling nature. The beam manipulation characteristics of the semiconducting element are determined, validating this element suitability for material processing.

引用

页码：81 / 86

页数：6

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