Six-Parameter Polarized Bidirectional Reflectance Distribution Function Model for Rough Surfaces

被引:8
|
作者
Zhu Darong [1 ,2 ]
Feng Kangkang [1 ,2 ]
Wang Fangbin [1 ,2 ]
Tao, Liu [1 ,2 ]
Fan, Sun [1 ,2 ]
Xue, Wang [1 ,2 ]
机构
[1] Anhui Jianzhu Univ, Sch Mech & Elect Engn, Hefei 230601, Anhui, Peoples R China
[2] Anhui Jianzhu Univ, Key Lab Construct Machinery Fault Diag & Early Wa, Hefei 230601, Anhui, Peoples R China
关键词
scattering; polarization; bidirectional reflectance distribution function; parameter inversion; rough surface; SCATTERING;
D O I
10.3788/LOP57.092901
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ideal surface has strong polarization properties, but the actual surface is usually rough, resulting in significant shadowing and severe diffuse reflection. In order to accurately characterize the polarization properties of rough surfaces, based on the micro-facet model, an improved six-parameter polarization bidirectional reflection distribution function (pBRDF) model is established considering the shadowing effect and diffuse reflection. Based on this, the expression of the optical reflection polarization degree of rough surface is derived. The degree of polarization of aluminum and black lacquer materials is simulated to invert the complex refractive index. The results show that the proposed model simulation value is more consistent with the experimental measurement value, and the complex refractive index inversion accuracy is higher. The pBRDF measurement is carried out on the 45 # steel material, and the distribution of polarization degrees under different incident angles reflection angles and roughness is analyzed. The experimental results show that the simulation values of the six-parameter model can be well matched with the experimental measurements, and the accuracy of the model is increased by modeling the diffuse reflection part. This work can be used as a theoretical basis and method for the detection and analysis of rough surfaces.
引用
收藏
页数:7
相关论文
共 17 条
  • [1] [Anonymous], LASER OPTOELECTRONIC
  • [2] Chen W L, 2018, ACTA OPT SINICA, V38
  • [3] [冯巍巍 Feng Weiwei], 2008, [光学学报, Acta Optica Sinica], V28, P290
  • [4] Minnaert M., 1911, ASTROPHYSICAL J LETT, V93, P103
  • [5] Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces
    Priest, RG
    Meier, SR
    [J]. OPTICAL ENGINEERING, 2002, 41 (05) : 988 - 993
  • [6] Four-parameter model for polarization-resolved rough-surface BRDF
    Renhorn, Ingmar G. E.
    Hallberg, Tomas
    Bergstrom, David
    Boreman, Glenn D.
    [J]. OPTICS EXPRESS, 2011, 19 (02): : 1027 - 1036
  • [8] Polarization-based index of refraction and reflection angle estimation for remote sensing applications
    Thilak, Vimal
    Voelz, David G.
    Creusere, Charles D.
    [J]. APPLIED OPTICS, 2007, 46 (30) : 7527 - 7536
  • [9] Watson R, 2001, P SPIE INT SOC OPTIC, V1370, P159
  • [10] Xu F F, 2016, LASER OPTOELECTRONIC, V53